Digital Systems Testing And Testable Design Solution [repack] Jun 2026

user wants a long article on digital systems testing and testable design solutions. This is a broad topic in electronic engineering. I need to provide comprehensive coverage. The plan involves searching for various aspects: fundamental concepts, DFT techniques (scan chains, BIST, JTAG), ATPG, emerging trends (AI/ML, 3D ICs), and authoritative resources like textbooks. I'll follow the plan to search for these topics in parallel. search results provide a good starting point. I have information on course materials, DFT techniques, ATPG, SoC testing, AI in test, 3D IC testing, JTAG, and a key textbook. I need to gather more details. I'll open several of the most promising results to get specific details for the article. search results provide a solid foundation. I have information on course curricula (CMU, Fresno State) that outline core topics, articles detailing DFT techniques (scan chains, BIST, JTAG) and their benefits, and resources on ATPG, SoC testing, AI/ML in test, 3D IC testing, and system-level DFT. I also have references to the key textbook. The user's question has high authority requirements, I should prioritize using authoritative sources like academic courses and IEEE-related content. My plan is to structure the article with an introduction, sections on fault modeling and ATPG, DFT techniques (scan chains, BIST, JTAG), SoC and system-level testing, emerging trends (AI, 3D ICs), and a conclusion. I will cite the relevant sources for each section. Digital Systems Testing and Testable Design: A Comprehensive Solution

Adding multiplexers into critical timing paths can introduce propagation delays, slightly slowing down the maximum clock speed of the chip.

This involves replacing standard flip-flops with "scan cells." In test mode, these cells link together like a long shift register (a scan chain). This allows testers to "shift in" a specific internal state and "shift out" the results, effectively turning a complex sequential circuit into a simpler combinational one.