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Importantly, these advanced CMOS nodes are already qualified for high‑volume automotive and consumer electronics manufacturing, meaning that the process control and reliability data needed to ensure crack‑free operation is readily available.

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Additionally, the very avalanche process that makes SPADs so sensitive can generate hot carriers and energetic phonons, which may exacerbate pre‑existing defects. Studies have shown that stress conditions can induce a drift in the – the background noise of the SPAD in the absence of light – and this drift is often linked to the activation of defects at crack tips or along strained interfaces. Importantly, these advanced CMOS nodes are already qualified